ESPEC

Highly Accelerated Stress Test System (HAST Chamber)

Highly Accelerated Stress Test System (HAST Chamber)

HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks.

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